Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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10/11/2022
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Application #:
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16645946
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Filing Dt:
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03/10/2020
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Publication #:
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Pub Dt:
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01/06/2022
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Inventors:
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Young-sik Ghim, Hyug-gyo Rhee
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Title:
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APPARATUS AND METHOD FOR MEASURING THE THICKNESS AND REFRACTIVE INDEX OF MULTILAYER THIN FILMS USING ANGLE-RESOLVED SPECTRAL INTERFERENCE IMAGE ACCORDING TO POLARIZATION
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Assignment:
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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267, GAJEONG-RO, YUSEONG-GU |
DAEJEON, KOREA, REPUBLIC OF 34113 |
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MARK D. PASSLER, AKERMAN LLP |
777 S. FLAGLER DRIVE |
SUITE 1100, WEST TOWER |
WEST PALM BEACH, FL 33401 |
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