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Patent Assignment Abstract of Title
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Total Assignments: 2
Patent #:
Issue Dt:
03/14/2023
Application #:
17241142
Filing Dt:
04/27/2021
Publication #:
Pub Dt:
08/19/2021
Inventors:
Joannes Jitse VENSELAAR, Anagnostis TSIATMAS, Samee Ur REHMAN, Paul Christiaan HINNEN et al
Title:
METHOD OF DETERMINING INFORMATION ABOUT A PATTERNING PROCESS, METHOD OF REDUCING ERROR IN MEASUREMENT DATA, METHOD OF CALIBRATING A METROLOGY PROCESS, METHOD OF SELECTING METROLOGY TARGETS
Assignment: 1
Reel/Frame:
056064/0469Recorded: 04/28/2021Pages: 3
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
Exec Dt:
12/06/2017
Exec Dt:
12/06/2017
Exec Dt:
12/06/2017
Assignee:
P.O. BOX 324
VELDHOVEN, NETHERLANDS 5500 AH
Correspondent:
PILLSBURY WINTHROP SHAW PITTMAN, LLP
PO BOX 10500
MCLEAN, VA 22102
Assignment: 2
Reel/Frame:
056064/0476Recorded: 04/28/2021Pages: 6
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
Exec Dt:
03/12/2019
Exec Dt:
03/06/2019
Exec Dt:
03/11/2019
Exec Dt:
03/13/2019
Exec Dt:
03/13/2019
Exec Dt:
05/15/2019
Exec Dt:
03/06/2019
Exec Dt:
03/06/2019
Exec Dt:
03/06/2019
Assignee:
P.O. BOX 324
VELDHOVEN, NETHERLANDS 5500 AH
Correspondent:
PILLSBURY WINTHROP SHAW PITTMAN, LLP
PO BOX 10500
MCLEAN, VA 22102

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