Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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03/14/2023
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Application #:
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17873727
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Filing Dt:
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07/26/2022
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Publication #:
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Pub Dt:
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02/23/2023
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Inventors:
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Sung Hoon HONG, Hyun Jin CHANG, Hyun Chul LEE, Jack WOO
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Title:
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OVERLAY MARK, OVERLAY MEASUREMENT METHOD AND SEMICONDUCTOR DEVICE MANUFACTURING METHOD USING THE OVERLAY MARK
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| #15-23, DONGTANSANDAN 6-GIL, DONGTAN-MYEON |
| HWASEONG-SI, GYEONGGI-DO, KOREA, REPUBLIC OF 18487 |
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| NOVICK, KIM & LEE, PLLC |
| 3251 OLD LEE HIGHWAY, SUITE 500 |
| FAIRFAX, VA 22030 |
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