Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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03/28/2023
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Application #:
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17364221
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Filing Dt:
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06/30/2021
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Publication #:
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Pub Dt:
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12/08/2022
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Inventors:
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Robert J. Rathert, Oreste Donzella, David W. Price, Chet V. Lenox et al
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Title:
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SYSTEM AND METHOD FOR Z-PAT DEFECT-GUIDED STATISTICAL OUTLIER DETECTION OF SEMICONDUCTOR RELIABILITY FAILURES
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| ONE TECHNOLOGY DRIVE |
| MILPITAS, CALIFORNIA 95035 |
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| MATTHEW POULSEN, PHD. |
| SUITER SWANTZ INTELLECTUAL PROPERTY |
| 14301 FNB PARKWAY, SUITE 220 |
| OMAHA, NE 68154 |
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