Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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04/04/2023
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Application #:
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17535695
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Filing Dt:
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11/26/2021
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Inventors:
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Sang-il PARK, Byoung-Woon AHN, Seung-Ho HAN, Sang-Joon CHO
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Title:
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ATOMIC FORCE MICROSCOPE EQUIPPED WITH OPTICAL MEASUREMENT DEVICE AND METHOD OF ACQUIRING INFORMATION ON SURFACE OF MEASUREMENT TARGET USING THE SAME
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| KANC 4TH FLOOR, 109, GWANGGYO-RO, YEONGTONG-GU |
| SUWON-SI, GYEONGGI-DO, KOREA, REPUBLIC OF 16229 |
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| INVENSTONE PATENT, LLC |
| 14291-A BRUSHWOOD WAY |
| CENTREVILLE, VA 20121 |
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