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Patent Assignment Abstract of Title
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Total Assignments: 1
Patent #:
Issue Dt:
06/06/2023
Application #:
16272528
Filing Dt:
02/11/2019
Publication #:
Pub Dt:
01/23/2020
Inventors:
Vaibhav Gaind, Amrit Poudel, Grace H. Chen, Mark S. Wang
Title:
Multimode Defect Classification in Semiconductor Inspection
Assignment: 1
Reel/Frame:
048299/0210Recorded: 02/11/2019Pages: 7
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
Exec Dt:
02/01/2019
Exec Dt:
01/22/2019
Exec Dt:
02/11/2019
Exec Dt:
02/08/2019
Assignee:
ONE TECHNOLOGY DRIVE
MILPITAS, CALIFORNIA 95035
Correspondent:
CHARLES HUSE
940 STEWART DR. #296
SUNNYVALE, CA 94085-3912

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