Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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09/19/2023
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Application #:
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17589758
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Filing Dt:
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01/31/2022
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Publication #:
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Pub Dt:
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05/19/2022
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Inventors:
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Eyal FAYNEH, Evelyn LANDMAN, Shai COHEN, Guy REDLER, Inbar WEINTROB
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Title:
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INTEGRATED CIRCUIT I/O INTEGRITY AND DEGRADATION MONITORING
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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2 PAL-YAM AVENUE |
HAIFA, ISRAEL 3309502 |
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THE ROY GROSS LAW FIRM, LLC |
50 WASHINGTON STREET, SUITE 737/745 |
NORWALK, CT 06854 |
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09/20/2024 10:10 AM
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