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Patent Assignment Abstract of Title
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Total Assignments: 1
Patent #:
Issue Dt:
10/24/2023
Application #:
17333770
Filing Dt:
05/28/2021
Publication #:
Pub Dt:
11/10/2022
Inventors:
Robert J. Rathert, David W. Price, Chet V. Lenox, Oreste Donzella, Kara L. Sherman et al
Title:
SYSTEMS AND METHODS FOR SEMICONDUCTOR ADAPTIVE TESTING USING INLINE DEFECT PART AVERAGE TESTING
Assignment: 1
Reel/Frame:
058020/0023Recorded: 11/04/2021Pages: 10
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
Exec Dt:
08/13/2021
Exec Dt:
07/25/2021
Exec Dt:
07/23/2021
Exec Dt:
07/22/2021
Exec Dt:
07/24/2021
Exec Dt:
07/26/2021
Assignee:
ONE TECHNOLOGY DRIVE
MILPITAS, CALIFORNIA 95035
Correspondent:
MATTHEW POULSEN, PHD.
SUITER SWANTZ INTELLECTUAL PROPERTY
14301 FNB PARKWAY, SUITE 220
OMAHA, NE 68154

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