Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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10/31/2023
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Application #:
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17897232
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Filing Dt:
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08/29/2022
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Inventors:
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Chad ROBERTS, George J. MORALES, Oscar MENDOZA, Kartik RAMANUJACHAR, Michael S. CHUN et al
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Title:
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PRODUCT DESIGN FOR TEST TO ENABLE ELECTRICAL NON-DESTRUCTIVE TEST FOR MEASURING MULTI-CHIP INTERCONNECT DEFECTS
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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2200 MISSION COLLEGE BLVD |
SANTA CLARA, CALIFORNIA 95054 |
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VIERING, JENTSCHURA & PARTNER MBB |
C/O 444 BRICKELL AVENUE |
SUITE 700 |
MIAMI, FL 33131 |
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06/07/2024 04:39 AM
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