Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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01/28/2025
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Application #:
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18287141
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Filing Dt:
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10/16/2023
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Publication #:
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Pub Dt:
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11/07/2024
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Inventors:
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Christian KARRAS, Tobias GNAUSCH, Robert BUETTNER, Kay REETZ, Armin GRUNDMANN et al
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Title:
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WAFER-LEVEL TEST METHOD FOR OPTOELECTRONIC CHIPS
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| GOESCHWITZER STRASSE 25 |
| JENA, GERMANY 07745 |
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| ALLISON CLARK |
| 125 S. ROYAL STREET |
| ALEXANDRIA, VA 22314 |
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10/09/2025 11:51 AM
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