Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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08/31/1982
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Application #:
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06210081
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Filing Dt:
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11/24/1980
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Inventor:
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RENE CULLET
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Title:
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TEST METHODS AND STRUCTURES FOR SEMICONDUCTOR INTEGRATED CIRCUITS FOR ELECTRICALLY DETERMINING CERTAIN TOLERANCES DURING THE PHOTOLITHOGRAPHIC STEPS
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST.
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A CORP. OF N.Y. |
ARMONK, NEW YORK 10504 |
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THEODORE E. GALANTHAY |
IBM CORPORATION |
DEPT. 901/BLDG. 300-482 |
HOPEWELL JUNCTION, NY 12533 |
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