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Patent Assignment Abstract of Title
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Total Assignments: 1
Patent #:
Issue Dt:
12/03/1985
Application #:
06582582
Filing Dt:
02/22/1984
Inventors:
PAUL SANDLAND, CURT H. CHADWICK, HOWARD I. DWYER
Title:
X-Y STAGE FOR A PATTERNED WAFER AUTOMATIC INSPECTION SYSTEM
Assignment: 1
Reel/Frame:
004244/0283Recorded: 04/16/1984Pages: 1
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST.
Assignors:
Exec Dt:
02/21/1984
Exec Dt:
02/21/1984
Exec Dt:
02/21/1984
Assignee:
2151 MISSION COLLEGE BLVD.,
SANTA CLARA,, CALIFORNIA 95054
Correspondent:
HAMRICK, HOFFMAN, GUILLOT & KAZUBOWSKI
777 NORTH FIRST STREET, SUITE 444
SAN JOSE, CA 95112

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