Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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12/03/1985
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Application #:
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06582582
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Filing Dt:
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02/22/1984
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Inventors:
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PAUL SANDLAND, CURT H. CHADWICK, HOWARD I. DWYER
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Title:
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X-Y STAGE FOR A PATTERNED WAFER AUTOMATIC INSPECTION SYSTEM
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST.
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2151 MISSION COLLEGE BLVD., |
SANTA CLARA,, CALIFORNIA 95054 |
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HAMRICK, HOFFMAN, GUILLOT & KAZUBOWSKI |
777 NORTH FIRST STREET, SUITE 444 |
SAN JOSE, CA 95112 |
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