Patent Assignment Abstract of Title
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Total Assignments:
2
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Patent #:
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Issue Dt:
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08/19/1986
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Application #:
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06694627
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Filing Dt:
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01/24/1985
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Inventors:
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TAKASHI MIYAZAWA, HIROYUKI FUKUCHI, SOSUKE TATEISHI
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Title:
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DEFECT DETECTING METHOD AND SYSTEM
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST.
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| 26-1, JINGUMEA 6-CHOME, SHIBUYA-KU |
| TOKYO-TO, JAPAN |
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| LESTER HORWITZ |
| LADAS & PARRY |
| 26 WEST 61ST ST. |
| NEW YORK, NY 10023 |
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Assignment:
2
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ASSIGNMENT OF ASSIGNORS INTEREST.
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| 17-1, NAMAMUGI 1-CHOME, TSURUMI-KU, YOKOHAMA-SHI |
| A JAPANESE CORP. |
| KANAGAWA-KEN, JAPAN |
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| WILLIAM R. EVANS |
| C/O LADAS & PARRY |
| 26 WEST 61ST STREET |
| NEW YORK, NY 10023 |
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