Patent Assignment Abstract of Title
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Total Assignments:
5
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Patent #:
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Issue Dt:
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02/24/1987
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Application #:
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06716986
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Filing Dt:
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03/28/1985
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Inventors:
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PAUL FINER, ROBERT O. WAHL, WILLIAM SILVERMAN
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Title:
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CALIBRATION STANDARD FOR X-RAY FLUORESCENCE THICKNESS
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST.
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| 60 OAK DRIVE |
| SYOSSET, NEW YORK 11791 |
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| ROBERT E. ISNER |
| 27 NORTH BROADWAY |
| P. O. BOX 609 |
| TARRYTOWN, NY 10591 |
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Assignment:
2
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SECURITY INTEREST (SEE DOCUMENT FOR DETAILS).
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| LORD DAY & LORD, BARRETT, SMITH |
| 1201 PENNSYLVANIA AVE., N.W. |
| WASHINGTON, DC 20004-2401 |
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Assignment:
3
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ASSIGNMENT OF ASSIGNORS INTEREST.
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| ERMINAL DRIVE, A DE CORP. |
| PLAINVIEW, NEW YORK 11803 |
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| KAYE, SCHOLER, FIERMAN, HAYS & HANDLER |
| 425 PARK AVENUE |
| NEW YORK, NY 10022 |
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Assignment:
4
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| 300 BROADHOLLOW ROAD |
| MELVILLE, NEW YORK 11747 |
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| SUITE 302 |
| 395 NORTH SERVICE ROAD |
| MELVILLE, NEW YORK 11747 |
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| HOFFMANN & BARON |
| GERALD T. BODNER, ESQ. |
| 350 JERICHO TURNPIKE |
| JERICHO, NY 11753 |
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Assignment:
5
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RELEASE OF SECURITY INTEREST
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| TERMINAL DRIVE |
| PLAINVIEW, NEW YORK 11803 |
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| KAYE, SCHOLER, FIERMAN, HAYS ET AL. |
| SHERYL GITTLITZ, ESQ. |
| 425 PARK AVENUE |
| NEW YORK, NY 10022 |
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