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Patent Assignment Abstract of Title
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Total Assignments: 1
Patent #:
Issue Dt:
05/01/1990
Application #:
07209758
Filing Dt:
06/22/1988
Inventors:
SHIN-ICHI KUNIEDA, MASAHIDE OZAWA
Title:
METHOD FOR TESTING SEMICONDUCTOR DEVICES
Assignment: 1
Reel/Frame:
004974/0577Recorded: 06/22/1988Pages: 2
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST.
Assignors:
Exec Dt:
06/15/1988
Exec Dt:
06/15/1988
Assignee:
401 ELLIS ST.
MOUNTAIN VIEW, CALIFORNIA 94039
Correspondent:
PAUL J. WINTERS
SKJERVEN, MORRILL, MAC PHERSON,
FRANKLIN & FRIEL
3600 PRUNERIDGE - SUITE 100
SANTA CLARA, CA 95051

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