Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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04/02/1991
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Application #:
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07302469
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Filing Dt:
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01/27/1989
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Inventor:
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KOUICHI FURUTA
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Title:
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SEMICONDUCTOR INTEGRATED CIRCUIT AND TEST METHOD FOR CHARACTERISTICS
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST.
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22-22, NAGAIKE-CHO, ABENO-KU |
OSAKA 545, JAPAN |
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MICHAEL K. MUTTER |
BIRCH, STEWART, KOLASCH & BIRCH |
301 NORTH WASHINGTON STREET |
P.O. BOX 747 |
FALLS CHURCH, VA 22046-0747 |
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