Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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06/15/1993
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Application #:
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07811506
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Filing Dt:
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12/20/1991
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Inventors:
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STEVEN G. BARBEE, LEPING LI, VICTOR J. SILVESTRI
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Title:
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INTERFEROMETER FOR IN SITU MEASUREMENT OF THIN FILM THICKNESS CHANGES
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST.
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A CORPORATION OF NY |
ARMONK, NEW YORK 10504 |
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JOHN W. HENDERSON, JR. |
IBM CORPORATION |
DEPT. 901, BLDG. 300-482 |
HOPEWELL JUNCTION, NY 12533 |
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