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Patent Assignment Abstract of Title
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Total Assignments: 1
Patent #:
Issue Dt:
08/24/1993
Application #:
07671614
Filing Dt:
03/19/1991
Inventors:
HIROYO MASUKO, RYOUZI TAKANO, TAKASHI HATANO, KIYOHUMI MITSUZE, ANG K. KEONG
Title:
LOOP TEST SYSTEM IN AN INTEGRATED CIRCUIT
Assignment: 1
Reel/Frame:
005703/0187Recorded: 04/24/1991Pages: 2
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST.
Assignors:
Exec Dt:
04/08/1991
Exec Dt:
04/08/1991
Exec Dt:
04/08/1991
Exec Dt:
04/08/1991
Exec Dt:
04/08/1991
Assignee:
1015, KAMIKODANAKA, NAKAHARA-KU, KAWASAKI-SHI
KANAGAWA, 211, JAPAN
Correspondent:
CHARLES M. MARMELSTEIN
ARMSTRONG, NIKAIDO, MARMELSTEIN,
KUBOVCIK & MURRAY
STE. 1000, 1725 K ST., NW
WASHINGTON, DC 20006

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