Patent Assignment Abstract of Title
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Total Assignments:
3
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Patent #:
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Issue Dt:
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06/27/1995
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Application #:
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08272106
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Filing Dt:
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07/07/1994
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Inventor:
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JUN SOO KO
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Title:
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A PROBE STRUCTURE FOR TESTING A SEMICONDUCTOR CHIP AND A PRESS MEMBER FOR SAME
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 16, WOOMYEON-DONG, SEOCHO-GU |
| SEOUL, 137-140, KOREA, REPUBLIC OF |
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| BIRCH, STEWART, KOLASCH & BIRCH |
| JOSEPH A. KOLASCH |
| P.O. BOX 747 |
| FALLS CHURCH, VA 22040-0747 |
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Assignment:
2
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CHANGE OF NAME (SEE DOCUMENT FOR DETAILS).
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| SAN 136-1, AMI-RI, BUBAL-EUB, ICHON-SHI |
| KYOUNGKI-DO, KOREA, REPUBLIC OF |
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| BLAKELY, SOKOLOFF, TAYLOR & ZAFMAN |
| ERIC S. HYMAN |
| 12400 WILSHIRE BOULEVARD |
| SEVENTH FLOOR |
| LOS ANGELES, CA 90025 |
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Assignment:
3
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 1 HYANGJEONG-DONG, HEUNGDUK |
| CHEONGJU CITY, CHUNG CHEONG BOK-DO, KOREA, REPUBLIC OF |
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| MATTHEW T. SMITH |
| DECHERT LLP |
| 4000 BELL ATLANTIC TOWER |
| 1717 ARCH STREET |
| PHILADELPHIA, PA 19103-2793 |
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