Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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08/01/1995
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Application #:
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08025435
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Filing Dt:
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03/03/1993
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Inventors:
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ISAAC MAZOR, NOAM KNOLL, YORAM UZIEL
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Title:
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PROCESS FOR MEASURING OVERLAY MISREGISTRATION DURING SEMICONDUCTOR WAFER FABRICATION
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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160 RIO ROBLES, P.O. BOX 49055 |
SAN JOSE, CA 95161 |
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CLAUDE A. S. HAMRICK |
ROSENBLUM, PARISH & ISAACS |
160 W. SANTA CLARA STREET, 15TH FL. |
SAN JOSE, CA 95113 |
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