Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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07/02/1996
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Application #:
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08232963
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Filing Dt:
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04/22/1994
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Inventor:
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WILFRED J. CORRIGAN
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Title:
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WAFER LEVEL INTEGRATED CIRCUIT TESTING WITH A SACRIFICIAL METAL LAYER
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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1551 MCCARTHY BLVD. |
MILPITAS, CALIFORNIA 95035 |
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POMS, SMITH, LANDE AND ROSE |
BRETON A. BOCCHIERI, ESQ. |
2029 CENTURY PARK EAST |
38TH FLOOR |
LOS ANGELES, CA 90067 |
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