Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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11/18/1997
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Application #:
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07796385
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Filing Dt:
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11/22/1991
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Inventors:
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IZUMI FUSEGAWA, HIROTOSHI YAMAGISHI, NOBUYOSHI FUJIMAKI, YUKIO KARASAWA
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Title:
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METHOD FOR TESTING ELECTRICAL PROPERTIES OF SILICON SINGLE CRYSTAL
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST.
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| 4-2, MARUNOUCHI 1 CHOME, CHIYODA-KU |
| TOKYO, JAPAN |
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| TERESA J. BANTA |
| TOWNSEND, SNIDER & BANTA |
| 1225 EYE STREET, N.W. - SUITE 500 |
| WASHINGTON, DC 20005 |
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