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Patent Assignment Abstract of Title
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Total Assignments: 2
Patent #:
Issue Dt:
01/20/1998
Application #:
08677916
Filing Dt:
07/09/1996
Inventors:
GERHARD BREHM, RUDOLF MAYRHUBER, JOHANN NIEDERMEIER
Title:
METHOD FOR THE GENERATION OF STACKING-FAULT-INDUCED DAMAGE ON THE BACK OF SEMICONDUCTOR WAFERS
Assignment: 1
Reel/Frame:
008109/0421Recorded: 07/09/1996Pages: 2
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
Exec Dt:
06/25/1996
Exec Dt:
06/25/1996
Exec Dt:
06/25/1996
Assignee:
JOHANNES-HES-HESS-STRASSE 24
BURGHAUSEN, GERMANY
Correspondent:
COLLARD & ROE P.C.
1077 NORTHERN BOULEVARD
ROSLYN, NY 11576
Assignment: 2
Reel/Frame:
015596/0720Recorded: 07/30/2004Pages: 18
Conveyance:
CHANGE OF NAME (SEE DOCUMENT FOR DETAILS).
Assignor:
Exec Dt:
01/22/2004
Assignee:
HANNS-SEIDEL-PLATZ 4
81737 MUNICH, GERMANY
Correspondent:
COLLARD & ROE, P.C.
EDWARD R. FREEDMAN
1077 NORTHERN BOULEVARD
ROSLYN, NY 11576

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