Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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04/14/1998
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Application #:
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08663021
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Filing Dt:
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06/07/1996
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Inventors:
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CHRISTOPHER J. EVANS, ROBERT E. PARKS
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Title:
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INTERFEROMETRIC THICKNESS VARIATION TEST METHOD FOR WINDOWS AND SILICON WAFERS USING A DIVERGING WAVEFRONT
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Assignment:
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY |
14TH AND CONSTITUTION |
WASHINGTON, DISTRICT OF COLUMBIA 20230 |
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NATIONAL INSTITUTE OF STANDARDS & TECH. |
MARCIA SALKELD |
BUILDING 820, ROOM 213 |
GAITHERSBURG, MD 20899 |
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