Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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06/02/1998
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Application #:
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08715942
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Filing Dt:
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09/19/1996
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Inventors:
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ROBERT D. EDWARDS, DU B. NGUYEN, JAMES J. POULIN, HAZARA S. RATHORE, RICHARD G. SMITH
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Title:
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HIGH TEMPERATURE ELECTROMIGRATION STRESS TEST SYSTEM, TEST SOCKET, AND USE THEREOF
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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OLD ORCHARD ROAD |
ARMONK, NEW YORK 10504 |
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IBM CORPORATION |
IRA DAVID BLECKER |
D/18G, B/300, ZIP 482 |
1580 ROUTE 52 |
HOPEWELL JCT., NY 12533-6531 |
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