Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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06/02/1998
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Application #:
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08767640
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Filing Dt:
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12/17/1996
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Inventor:
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TOHRU KOYAMA
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Title:
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METHOD OF ANALYZING FAILURE OF SEMICONDUCTOR DEVICE BY USING EMISSION MICROSCOPE AND SYSTEM FOR ANALYZING FAILURE OF SEMICONDUCTOR DEVICE
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 2-3, MARUNOUCHI 2-CHOME, CHIYDA-KU |
| TOKYO 100, JAPAN |
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| OBLON, SPIVAK, MCCLELLAND ET AL |
| ATTN: ROBERT F. GNUSE |
| ATTORNEYS AT LAW, FOURTH FLOOR |
| 1755 JEFFERSON DAVIS HIGHWAY |
| ARLINGTON, VA 22202 |
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