Patent Assignment Abstract of Title
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Total Assignments:
2
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Patent #:
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Issue Dt:
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10/06/1998
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Application #:
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08744454
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Filing Dt:
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11/07/1996
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Inventors:
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YOSHIO MORISHIGE, HISATO NAKAMURA, TETSUYA WATANABE
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Title:
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EXTRANEOUS SUBSTANCE INSPECTION APPARATUS FOR PATTERNED WAFER
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 16-3, HIGASHI 3-CHOME |
| SHIBUYA-KU, TOKYO, JAPAN |
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| FAY, SHARPE, BEALL, FAGAN, ET AL |
| THOMAS E. BEALL, JR. |
| 104 EAST HUME AVENUE |
| ALEXANDRIA, VA 22301 |
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Assignment:
2
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 24-14, NISHI-SHINBASHI 1-CHOME |
| MINATO-KU, TOKYO 105-8717, JAPAN |
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| JOHN R. MATTINGLY |
| MATTINGLY, STANGER & MALUR ET AL. |
| 1800 DIAGONAL ROAD, SUITE 370 |
| ALEXANDRIA, VIRGINIA 22314 |
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