Patent Assignment Abstract of Title
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Total Assignments:
4
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Patent #:
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Issue Dt:
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12/08/1998
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Application #:
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08823967
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Filing Dt:
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03/25/1997
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Inventor:
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DAVID S. KURTZ
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Title:
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APPARATUS FOR RAPID IN-SITU X-RAY STRESS MEASUREMENT DURING THERMAL CYCLING OF SEMICONDUCTOR WAFERS
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 7 COMMERCE DRIVE |
| DANBURY, CONNECTICUT 06810 |
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| RICHARD B. HAVILL |
| INTELLECTUAL PROPERTY/TECHNOLOGY LAW |
| P.O. BOX 14329 |
| RESEARCH TRIANGLE PARK, NC 27709 |
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Assignment:
2
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 3006 RESEARCH DRIVE |
| STATE COLLEGE, PENNSYLVANIA 16801 |
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| SHIPMAN & GOODWIN LLP |
| PATRICIA C. GAGNON |
| ONE AMERICAN ROW |
| HARTFORD, CT 06103 |
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Assignment:
3
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CONFIRMATORY LICENSE (SEE DOCUMENT FOR DETAILS).
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| 26 ELECTRONIC PARKWAY |
| ROME, NEW YORK 13441 |
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| HAROLD L. BURSTYN |
| 26 ELECTRONIC PARKWAY |
| AFRL/IFOJ |
| ROME, NY 13441-4514 |
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Assignment:
4
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| WEITZMANN SCIENCE PARK |
| REHOVOTH, ISRAEL 76100 |
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| WOLF BLOCK SCHORR & SOLIS-COHEN |
| 1650 ARCH STREET |
| 22ND FLOOR |
| PHILADELPHIA, PA 19103 |
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