Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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02/09/1999
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Application #:
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08784749
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Filing Dt:
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01/16/1997
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Inventors:
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NEIL RICHARDSON, FARID ASKARY, STEFANO E. CONCINA, KEVIN M. MONAHAN, DAVID L. ADLER
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Title:
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ELECTRON BEAM DOSE CONTROL FOR SCANNING ELECTRON MICROSCOPY AND CRITICAL DIMENSION MEASUREMENT INSTRUMENTS
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 160 RIO ROBLES STREET |
| SAN JOSE, CALIFORNIA 95161 |
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| PETERS, VERNY ET AL. |
| ALLSTON L. JONES |
| 385 SHERMAN AVENUE, SUITE 6 |
| PALO ALTO, CA 94306-1840 |
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