Patent Assignment Abstract of Title
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Total Assignments:
3
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Patent #:
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Issue Dt:
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10/12/1999
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Application #:
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08637244
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Filing Dt:
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04/24/1996
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Inventor:
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PETER G. BORDEN
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Title:
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SYSTEM AND METHOD FOR MEASURING PROPERTIES OF A SEMICONDUCTOR SUBSTRATE IN A FABRICATION LINE
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 2371 BRANNER DRIVE |
| MENLO PARK, CALIFORNIA 94025 |
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| GRAY, CARY, WARE & FREIDENRICH |
| TIMOTHY W. LOHSE |
| 400 HAMILTON AVENUE |
| PALO ALTO, CALIFORNIA 94301 |
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Assignment:
2
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 2881 SCOTT BLVD |
| SANTA CLARA, CALIFORNIA 95050 |
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| SILICON VALLEY PATENT GROUP LLP |
| 18805 COX AVENUE |
| SUITE 220 |
| SARATOGA, CA 95070 |
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Assignment:
3
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| PRIELLE KORNELIA U.2., H-1117 |
| BUDAPEST, HUNGARY |
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| SILICON VALLEY PATENT GROUP LLP |
| 18805 COX AVENUE |
| SUITE 220 |
| SARATOGA, CA 95070 |
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