Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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11/30/1999
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Application #:
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09146096
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Filing Dt:
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09/03/1998
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Inventor:
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NORIKO WATANABE
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Title:
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APPARATUS AND A METHOD FOR MEASURING A DENSITY OF DEFECTS EXISTING IN A SEMICONDUCTOR WAFER AND AN APPARATUS AND A METHOD FOR MEASURING AN INHERENT SCATTERING INTENSITY OF DEFECTS EXISTING IN A SEMICONDUCTOR WAFER
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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2612, SHINOMIYA |
HIRATSUKA-SHI, KANAGAWA, JAPAN |
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WELSH & KATZ, LTD. |
GERALD T. SHEKLETON, ESQ. |
120 SOUTH RIVERSIDE PLAZA |
22ND FLOOR |
CHICAGO, IL 60603-3913 |
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