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Patent Assignment Abstract of Title
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Total Assignments: 1
Patent #:
6255125
Issue Dt:
07/03/2001
Application #:
09277093
Filing Dt:
03/26/1999
Inventors:
REGINA T. SCHMIDT, CHRISTOPHER A. SPENCE, ANNA M. MINVIELLE, MARINA V. PLAT et al
Title:
METHOD AND APPARATUS FOR COMPENSATING FOR CRITICAL DIMENSION VARIATIONS IN THE PRODUCTION OF A SEMICONDUCTOR WAFER
Assignment: 1
Reel/Frame:
009869/0602Recorded: 03/26/1999Pages: 7
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
SCHMIDT, REGINA T.
Exec Dt:
03/02/1999
MINVIELLE, ANNA M.
Exec Dt:
02/19/1999
NGUYEN, KHANH B.
Exec Dt:
02/25/1999
SPENCE, CHRISTOPHER A.
Exec Dt:
02/19/1999
PLAT, MARINA V.
Exec Dt:
02/19/1999
Assignee:
ADVANCED MICRO DEVICES
P.O. BOX 3453
ONE AMD PLACE
SUNNYVALE, CALIFORNIA 94088
Correspondent:
RENNER, OTTO, BOISSELLE & SKLAR, P.L.L.
NAINESH P. SHAH
1621 EUCLID AVENUE, 19TH FLOOR
CLEVELAND, OHIO 44115

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