Patent Assignment Abstract of Title
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Total Assignments:
2
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Patent #:
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Issue Dt:
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11/27/2001
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Application #:
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09232928
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Filing Dt:
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01/19/1999
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Inventor:
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YUUICHI SATOU
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Title:
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APPARATUS FOR ACCURATELY MEASURING LOCAL THICKNESS OF INSULATING LAYER ON SEMICONDUCTOR WAFER DURING POLISHING AND POLISHING SYSTEM USING THE SAME
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| MINATO-KU |
| 7-1, SHIBA 5-CHOME |
| TOKYO, JAPAN |
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| LAFF, WHITESEL, CONTE & SARET, LTD. |
| J. WARREN SHITESEL |
| 401 NORTH MICHIGAN AVE. |
| CHICAGO, IL 60611-4212 |
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Assignment:
2
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 6545 U.S.1 |
| GRANT, FLORIDA 32949 |
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| BOMBARDIER RECREATIONAL PRODUCTS |
| LEGAL SERVICES - ST-BRUNO |
| PO BOX 230 |
| NORTON, VT 05907-0230 |
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