Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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12/11/2001
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Application #:
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08908794
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Filing Dt:
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08/08/1997
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Inventors:
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NGUYEN DUC BUI, MICHAEL A. NIEDERHOFER, VAN HUNG PHAM
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Title:
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METHOD AND APPARATUS FOR RELIABILITY TESTING OF INTEGRATED CIRCUIT STRUCTURES AND DEVICES
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| P.O. BOX 3453 |
| ONE AMD PLACE |
| SUNNYVALE, CALIFORNIA 94088 |
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| OPPENHEIMER POMS SMITH |
| CLAUDE A. S. HAMRICK |
| TEN ALMADEN BLVD., STE. 600 |
| SAN JOSE, CA 95113 |
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