Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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04/23/2002
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Application #:
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09548875
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Filing Dt:
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04/13/2000
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Inventors:
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Anthony Le, Rochit Rajsuman, James Alan Turnquist, Shigeru Sugamori
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Title:
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Glitch detection for semiconductor test system
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| SHINJUKU-KU |
| NS BUILDING, 4-1 NISHI-SHINJUKU 2-CHOME |
| TOKYO, JAPAN |
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| MURAMATSU & ASSOCIATES |
| YASUO MURAMATSU |
| SECOND FLOOR |
| 7700 IRVINE CENTER DRIVE, SUITE 225 |
| IRVINE, CA 92618 |
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