Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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05/07/2002
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Application #:
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09597577
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Filing Dt:
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06/20/2000
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Inventors:
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Tetsuo Suzuki, Kunio Otsuka
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Title:
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METHOD OF EVALUATING QUALITY OF SILICON WAFER AND METHOD OF RECLAIMING THE WAFER
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 3-18, WAKINOHAMA-CHO 1-CHOME |
| CHUO-KU, KOBE-SHI, HYOGO, JAPAN 651-0 |
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| 31031 HUNTWOOD AV. |
| HAYWARD, CALIFORNIA 94544 |
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| OBLON SPIVAK MCCLELLAND, ET AL. |
| NORMAN F. OLBLON |
| FOURTH FLOOR |
| 1755 JEFFERSON DAVIS HIGHWAY |
| ARLINGTON, VA 22202 |
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