Patent Assignment Abstract of Title
NOTE:Results display only for issued patents and published applications.
For pending or abandoned applications please consult USPTO staff.
|
Total Assignments:
2
|
|
Patent #:
|
|
Issue Dt:
|
08/27/2002
|
Application #:
|
09893475
|
Filing Dt:
|
06/29/2001
|
|
Inventors:
|
Martin Commons, Tobias Mono, Velt Klee, John Pohl, Paul Wensley
|
|
Title:
|
METHOD OF MEASURING COMBINED CRITICAL DIMENSION AND OVERLAY IN SINGLE STEP
|
|
|
Assignment:
1
|
|
|
|
|
|
|
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
|
|
|
|
|
|
|
|
|
| 1730 NORTH FIRST STREET |
| SAN JOSE, CALIFORNIA 95112 |
|
|
|
|
| INFINEON TECHNOLOGIES NORTH AMERICA CORP |
| C/O SIEMENS CORPORATION |
| ELSA KELLER |
| 186 WOOD AVENUE SOUTH |
| ISELIN, NJ 08830 |
|
|
|
Assignment:
2
|
|
|
|
|
|
|
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
|
|
|
|
|
|
|
|
|
| ST. MARTIN-STR. 53 |
| 8154 MUNICH, GERMANY |
|
|
|
|
| SIEMENS CORPORATION |
| ELSA KELLER |
| INTELLECTUAL PROPERTY DEPARTMENT |
| 186 WOOD AVENUE SOUTH |
| ISELIN, NJ 08830 |
|
|
Search Results as of:
09/25/2024 10:00 AM
If you have any comments or questions concerning the data displayed,
contact
PRD / Assignments at 571-272-3350. v.2.6
Web interface last modified:
August 25, 2017 v.2.6
|
