Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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08/27/2002
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Application #:
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09274706
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Filing Dt:
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03/23/1999
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Inventor:
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BYUNG-CHUL KI
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Title:
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PARALLEL BIT TESTING CIRCUITS AND METHODS FOR INTEGRATED CIRCUIT MEMORY DEVICES SHARED TEST DRIVERS
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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416 MAETAN-DONG, PALDAL-GU |
SUWON-CITY, KYUNGKI-DO, KOREA, REPUBLIC OF |
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MYERS BIGEL SIBLEY & SAJOVEC |
MITCHELL S. BIGEL |
P.O. BOX 37428 |
RALEIGH, NORTH CAROLINA 27627 |
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