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Patent Assignment Abstract of Title
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Total Assignments: 2
Patent #:
Issue Dt:
09/17/2002
Application #:
09551715
Filing Dt:
04/18/2000
Inventors:
Isaac Mazor, Boris Yokhin, David Bar-On
Title:
DIFFERENTIAL MEASUREMENT OF X-RAY MICROFLUORESCENCE
Assignment: 1
Reel/Frame:
010739/0278Recorded: 04/18/2000Pages: 3
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
Exec Dt:
04/10/2000
Exec Dt:
04/10/2000
Exec Dt:
04/10/2000
Assignee:
P.O. BOX 103
MIGDAL HA'EMEK, IRAN, ISLAMIC REPUBLIC OF 10550
Correspondent:
HOFFMAN, WASSON & GITLER, PC
CHRISTOPHER J. MCDONALD, ESQ
2361 JEFFERSON DAVIS HIGHWAY
SUITE 522
ARLINGTON, VA 22202
Assignment: 2
Reel/Frame:
023750/0885Recorded: 01/10/2010Pages: 6
Conveyance:
CHANGE OF NAME (SEE DOCUMENT FOR DETAILS).
Assignor:
Exec Dt:
11/11/2004
Assignee:
P.O. BOX 103
MIGDAL HAEMEK, ISRAEL 23100
Correspondent:
D. KLIGLER I.P. SERVICES LTD
P.O. BOX 33111
TEL AVIV, 61330 ISRAEL

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