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Patent Assignment Abstract of Title
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Total Assignments: 1
Patent #:
Issue Dt:
10/08/2002
Application #:
09650342
Filing Dt:
08/28/2000
Inventor:
Daniel P. Cram
Title:
METHOD AND SYSTEM FOR WAFER LEVEL TESTING AND BURNING-IN SEMICONDUCTOR COMPONENTS
Assignment: 1
Reel/Frame:
011045/0894Recorded: 08/28/2000Pages: 7
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignor:
Exec Dt:
08/21/2000
Assignee:
8000 SOUTH FEDERAL WAY
BOISE, IDAHO 83706
Correspondent:
THE LAW OFFICE OF STEPHEN A. GRATTON
STEPHEN A. GRATTON
2764 SOUTH BRAUN WAY
LAKEWOOD, COLORADO 80228

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