Patent Assignment Abstract of Title
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Total Assignments:
2
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Patent #:
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Issue Dt:
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12/31/2002
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Application #:
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10119838
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Filing Dt:
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04/11/2002
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Inventors:
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Masakazu Nakabayashi, Tadayuki Yosiyama
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Title:
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METHOD OF MEASURING TRENCH DEPTH OF SEMICONDUCTOR DEVICE
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 2-3, MARUNOUCHI 2-CHOME, CHIYODA-KU |
| TOKYO, JAPAN 100-8 |
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| OBLON, SPIVAK, MCCLLEAND, MAIER & |
| NEUSTADT, ATTORNEYS AT LAW |
| MARVIN J. SPIVAK |
| 1755 JEFFERSON DAVIS HWY., FOURTH FLOOR |
| ARLINGTON, VIRGINIA 22202 |
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Assignment:
2
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RE-RECORD TO CORRECT THE LAST NAME OF THE SECOND ASSIGNOR, PREVIOUSLY RECORDED ON REEL 012783 FRAME 0245, ASSIGNOR CONFIRMS THE ASSIGNMENT OF THE ENTIRE INTEREST.
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| 2-3, MARUNOUCHI 2-CHOME, CHIYODA-KU |
| TOKYO 100-8310, JAPAN |
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| OBLON, SPIVAK, MCCLELLAND, MAIER, ET AL |
| JOSEPH A. SCAFETTA, JR. |
| 1940 DUKE STREET |
| ALEXANDRIA, VIRGINIA 22314 |
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