Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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02/25/2003
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Application #:
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09865870
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Filing Dt:
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05/25/2001
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Inventors:
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Ronald A. Powell, E. Derryck Settles, Sridhar K. Kailasam
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Title:
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METHOD AND APPARATUS FOR IN-SITU MEASUREMENT OF THICKNESS OF COPPER OXIDE FILM USING OPTICAL REFLECTIVITY
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 4000 NORTH FIRST STREET |
| SAN JOSE, CALIFORNIA 95134 |
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| SKJERVEN MORRILL LLP |
| K. ALISON DE RUNTZ |
| THREE EMBARCADERO CENTER, 28TH FLOOR |
| SAN FRANCISCO, CA 94111 |
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