Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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02/25/2003
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Application #:
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09633204
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Filing Dt:
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08/07/2000
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Inventors:
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Geeng-Lih Lin, Shien-Wang Lo
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Title:
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METHOD FOR GENERATE WAFER TESTING PROGRAM
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| SCIENCE-BASED INDUSTRIAL PARK |
| NO. 123, PARK AVE-3RD. |
| HSINCHU, TAIWAN R.O.C |
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| HARNESS, DICKEY & PIERCE, P.L.C. |
| THOMAS T. MOGA |
| P.O. BOX 828 |
| BLOOMFIELD HILLS, MI 48303 |
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