Patent Assignment Abstract of Title
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Total Assignments:
2
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Patent #:
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Issue Dt:
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04/08/2003
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Application #:
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09533157
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Filing Dt:
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03/23/2000
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Inventors:
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Seung Woo Kim, Gee Hong Kim
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Title:
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METHOD FOR MEASURING A THICKNESS PROFILE AND A REFRACTIVE INDEX USING WHITE-LIGHT SCANNING INTERFEROMETRY AND RECORDING MEDIUM THEREFOR
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 373-1 KOOSUNG-DONG |
| YOOSUNG-KU, TAEJUN 305-701, KOREA, REPUBLIC OF |
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| AKIN, GUMP, STRAUSS, HAUER & FELD, LLP |
| LESLIE L. KASTEN, JR. |
| ONE COMMERCE SQUARE |
| 2005 MARKET STREET - SUITE 2200 |
| PHILADELPHIA, PA 19103 |
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Assignment:
2
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| 21 LAUREL BROOK ROAD |
| MIDDLEFIELD, CONNECTICUT 06455 |
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| MARC M. WEFERS |
| FISH & RICHARSON P.C. |
| 225 FRANKLIN STREET |
| BOSTON, MA 02110 |
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