Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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06/10/2003
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Application #:
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09545730
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Filing Dt:
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04/08/2000
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Inventors:
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Anthony Le, Rochit Rajsuman, James Alan Trunquist, Shigeru Sugamori
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Title:
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DATA FAILURE MEMORY COMPACTION FOR SEMICONDUCTOR TEST SYSTEM
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| NS BUILDING |
| 4-1 NISHI-SHINJUKU 2-CHOME |
| SHINJUKU-KU, TOKYO, JAPAN |
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| MURAMATSU & ASSOCIATES |
| YASUO MURAMATSU |
| SECOND FLOOR - SUITE 225 |
| 7700 IRVINE CENTER DRIVE |
| IRVINE, CA 92618 |
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