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Patent Assignment Abstract of Title
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Total Assignments: 3
Patent #:
Issue Dt:
07/01/2003
Application #:
09568286
Filing Dt:
05/10/2000
Inventor:
Alex Maznev
Title:
OPTICAL METHOD FOR MEASURING THIN METAL FILMS
Assignment: 1
Reel/Frame:
010800/0765Recorded: 05/10/2000Pages: 2
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignor:
Exec Dt:
05/09/2000
Assignee:
1251 AVENUE OF THE AMERICAS
NEW YORK, NEW YORK 10020
Correspondent:
PHILIPS ELECTRONICS NORTH AMERICA CORP.
TONY PIOTROWSKI
580 WHITE PLAINS ROAD
TARRYTOWN, NY 10591
Assignment: 2
Reel/Frame:
013536/0664Recorded: 04/03/2003Pages: 2
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignor:
Exec Dt:
04/02/2003
Assignee:
GROENEWOUDSEWEG 1
5621 BA EINDHOVEN, NETHERLANDS
Correspondent:
PHILIPS ELECTRONICS NORTH AMERICA CORP.
TONY E. PIOTROWSKI
580 WHITE PLAINS ROAD
TARRYTOWN, NY 10591
Assignment: 3
Reel/Frame:
018454/0090Recorded: 10/30/2006Pages: 8
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignor:
Exec Dt:
10/05/2006
Assignee:
12 MICHIGAN DRIVE
NATICK, MASSACHUSETTS 01760
Correspondent:
DANA BREITMAN
599 LEXINGTON AVENUE
GOODWIN PROCTER LLP
NEW YORK, NY 10022

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