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Patent Assignment Abstract of Title
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Total Assignments: 1
Patent #:
Issue Dt:
09/16/2003
Application #:
09698167
Filing Dt:
10/30/2000
Inventors:
Shunji Maeda, Atsushi Yoshida, Yukihiro Shibata, Toshihiko Nakata, Hiroaki Shishido et al
Title:
METHOD AND APPARATUS FOR INSPECTING DEFECTS IN A PATTERNED SPECIMEN
Assignment: 1
Reel/Frame:
011392/0899Recorded: 10/30/2000Pages: 2
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
Exec Dt:
09/27/2000
Exec Dt:
09/28/2000
Exec Dt:
09/27/2000
Exec Dt:
09/27/2000
Exec Dt:
09/27/2000
Exec Dt:
09/27/2000
Exec Dt:
09/27/2000
Assignee:
6, KANDA SURUGADAI 4-CHOME, CHIYODA-KU
TOKYO, JAPAN
Correspondent:
ANTONELLI, TERRY, STOUT & KRAUS, LLP
ALAN E. SCHIAVELLI
1300 NORTH SEVENTEENTH STREET
SUITE 1800
ARLINGTON, VA 22209

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