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Patent Assignment Abstract of Title
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Total Assignments: 2
Patent #:
Issue Dt:
09/30/2003
Application #:
09748279
Filing Dt:
12/27/2000
Publication #:
Pub Dt:
08/23/2001
Inventors:
Megumi Takemoto, Shigeki Maekawa, Yoshihiro Kashiba, Yoshinori Deguchi, Masahiro Tanaka
Title:
PROBE CARD FOR TESTING SEMICONDUCTOR INTEGRATED CIRCUIT AND METHOD OF MANUFACTURING THE SAME
Assignment: 1
Reel/Frame:
011649/0399Recorded: 04/03/2001Pages: 4
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
Exec Dt:
01/09/2001
Exec Dt:
01/09/2001
Exec Dt:
01/09/2001
Exec Dt:
01/12/2001
Exec Dt:
01/15/2001
Assignee:
2-3, MARUNOUCHI 2-CHOME
CHIYODA-KU, TOKYO 100-8310, JAPAN
Correspondent:
BURNS, DOANE, SWECKER & MATHIS, L.L.P.
PLATON N. MANDROS
P.O. BOX 1404
ALEXANDRIA, VIRGINIA 22313-1404
Assignment: 2
Reel/Frame:
013128/0744Recorded: 09/30/2002Pages: 146
Conveyance:
SECURITY AGREEMENT
Assignors:
Exec Dt:
08/16/2002
Exec Dt:
08/16/2002
Exec Dt:
08/16/2002
Exec Dt:
08/16/2002
Exec Dt:
08/16/2002
Exec Dt:
08/16/2002
Exec Dt:
08/16/2002
Exec Dt:
08/16/2002
Exec Dt:
08/16/2002
Assignee:
AGENCY MANAGEMENT-MAIL CA5-701-05-19
1455 MARKET STREET
SAN FRANCISCO, CALIFORNIA 94103
Correspondent:
ACCESS INFORMATION SERVICES, INC.
JACKIE LEE
1773 WESTERN AVENUE
ALBANY, NY 12203

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