Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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06/22/2004
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Application #:
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09629407
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Filing Dt:
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08/01/2000
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Inventors:
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Allan Rosencwaig, Jon Opsal
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Title:
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MEASUREMENT OF THIN FILMS AND BARRIER LAYERS ON PATTERNED WAFERS WITH X-RAY REFLECTOMETRY
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 1250 RELIANCE WAY |
| FREMONT, CALIFORNIA 94539 |
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| LIMBACH & LIMBACH L.L.P. |
| ERIC N. HOOVER |
| 2001 FERRY BUILDING |
| SAN FRANCISCO, CA 94111 |
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