Patent Assignment Abstract of Title
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Total Assignments:
2
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Patent #:
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Issue Dt:
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10/12/2004
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Application #:
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09681438
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Filing Dt:
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04/05/2001
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Publication #:
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Pub Dt:
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10/10/2002
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Inventors:
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Carl F. Barnhart, Robert W. Bassett, Brion L. Keller, David E. Lackey, Mark R. Taylor et al
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Title:
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METHOD FOR TESTING INTEGRATED LOGIC CIRCUITS
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| NEW ORCHARD ROAD |
| ARMONK, NEW YORK 10504 |
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| ARLEN L. OLSEN |
| SCHMEISER, OLSEN & WATTS |
| 3 LEAR JET LANE |
| SUITE 201 |
| LATHAM, NY 12110 |
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Assignment:
2
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 2655 SEELY AVENUE |
| SAN JOSE, CALIFORNIA 95134 |
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| JEFFREY A. MILLER |
| 4 PARK PLAZA, SUITE 1600 |
| IP PROSECUTION DEPARTMENT |
| IRVINE, CA 92614 |
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